XAFS studies of nickel-doped lead tellur
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Ivana Radisavljević; Nikola Novaković; Nenad Ivanović; Nebojša Romčević; Miodrag
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Article
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2009
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Elsevier Science
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English
⚖ 137 KB
The problem of impurities and defect states in lead telluride-based semiconductors is of crucial importance for their practical applications. X-ray absorption fine structure (XAFS) techniques are capable to address some of the key issues regarding impurities position, their valent state, as well as