X-ray topography of GdCa4O(BO3)3single crystals grown by the Czochralski method

✍ Scribed by Wierzbicka, E. ;Kłos, A. ;Lefeld-Sosnowska, M. ;Pajączkowska, A.

• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 387 KB
• Volume: 203
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200521030

✦ Synopsis

Abstract

GdCa~4~O(BO~3~)~3~ single crystals grown by the Czochralski technique were investigated by conventional transmission and back‐reflection X‐ray topography. The results were correlated with the growth conditions and stoichiometry of the crystals. Extended defects, especially dislocations, with different density, in samples cut perpendicular and parallel to the b‐axis were investigated. Long, straight dislocations lying perpendicular to [100] and [010] directions were observed. Periodical, small fluctuations of the diameter induced some defects. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)