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X-ray topographic identification of dislocation nucleation mechanisms in the heteroepitaxial system GaAs/Ge

✍ Scribed by Burle, N. ;Pichaud, B. ;Guelton, N. ;Saint-Jacques, R. G.


Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
479 KB
Volume
149
Category
Article
ISSN
0031-8965

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