X-ray topographic identification of dislocation nucleation mechanisms in the heteroepitaxial system GaAs/Ge

✍ Scribed by Burle, N. ;Pichaud, B. ;Guelton, N. ;Saint-Jacques, R. G.

• Publisher: John Wiley and Sons
• Year: 1995
• Tongue: English
• Weight: 479 KB
• Volume: 149
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211490109