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X-ray study of structural features of GaSb(Si) single crystals grown using a set of diffraction methods under various heat and mass transfer conditions

✍ Scribed by I. A. Prokhorov; Yu. A. Serebryakov; E. N. Korobeinikova; B. G. Zakharov; V. V. Ratnikov; I. L. Shul’pina


Book ID
110202772
Publisher
Pleiades Publishing
Year
2007
Tongue
English
Weight
389 KB
Volume
1
Category
Article
ISSN
1027-4510

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