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X-ray standing-wave analysis of the Bi preferential distribution in Y3−xBixFe5O12 thin films

✍ Scribed by Kazimirov, A. Yu. ;Kovalchuk, M. V. ;Sosphenov, A. N. ;Kohn, V. G. ;Kub, J. ;Novák, P. ;Nevřiva, M. ;Čermák, J.


Book ID
114514831
Publisher
International Union of Crystallography
Year
1992
Tongue
English
Weight
814 KB
Volume
48
Category
Article
ISSN
0108-7681

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