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X-ray Scattering Study of Thin Films of Poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene)

✍ Scribed by Chabinyc, Michael L.; Toney, Michael F.; Kline, R. Joseph; McCulloch, Iain; Heeney, Martin


Book ID
111973831
Publisher
American Chemical Society
Year
2007
Tongue
English
Weight
602 KB
Volume
129
Category
Article
ISSN
0002-7863

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We have used particle induced X-ray emission analysis and particle induced gamma-ray emission analysis to determine the elemental impurity concentrations in poly [(2,5-bis(3decylthiophen-2-yl)thieno[2,3-b]thiophene] samples that have undergone different washing and extraction procedures to remove im