𝔖 Bobbio Scriptorium
✦   LIBER   ✦

X-ray scattering from thin organic films and multilayers

✍ Scribed by U. Pietsch; T. A. Barberka; Th. Geue; R. Stömmer


Publisher
Italian Physical Society
Year
1997
Tongue
English
Weight
872 KB
Volume
19
Category
Article
ISSN
0392-6737

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Thin Film Analysis by X-Ray Scattering (
✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 98 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

Thin Film Analysis by X-Ray Scattering (
✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 678 KB

Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr

Thin Film Analysis by X-Ray Scattering (
✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 766 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t