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X-ray refractive index of silicon in the range 400 to 1100eV

✍ Scribed by S.C. Woronick; W. Ng; A. Król; Y.H. Kao

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 343 KB
Volume: 53
Category: Article
ISSN: 0022-3697
DOI: 10.1016/0022-3697(92)90243-7

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