✦ LIBER ✦
X-ray photoelectron spectroscopy of SiO2-Si interfacial regions: Ultrathin oxide films : S. I. Raider and R. Flitsch. IBM J. Res. Dev.22, (3) 294 (May 1978)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 120 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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