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X-ray photoelectron spectroscopy of polybithiophene–polystyrene composites

✍ Scribed by F. Samir; M. Morsli; J. C. Bernède; A. Bonnet; S. Lefrant

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
201 KB
Volume
66
Category
Article
ISSN
0021-8995

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✦ Synopsis

An investigation of the structure, stability, and charge distributions of conducting polybithiophene-polystyrene composite chemically synthetized using X-ray photoelectron spectroscopy (XPS) and electron microprobe analysis is described. XPS results confirm the reduction of the oxidant (Fe 3/ is reduced to Fe 2/ and Cu 2/ to Cu / ) during the bithiophene polymerization and indicate that the positive charges of doped polybithiophene are preferentially localized on the carbon atoms. Measurements versus ambient atmosphere exposure support a decreasing of the atomic ratio Cl/Fe or Cl/Cu and an increasing of the atomic ratio O/C, which could be responsible for the observed electrical conductivity instability.

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