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X-ray photoelectron spectroscopy of alkali tellurite glasses

✍ Scribed by Y. Himei; Y. Miura; T. Nanba; A. Osaka


Book ID
117148122
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
603 KB
Volume
211
Category
Article
ISSN
0022-3093

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This paper describes the characterization by x-ray photoelectron spectroscopy (XPS) of several Ge-doped silica glasses before and after reactive ion etching (ME) in sulphur hexafluoride (SF,). These glasses have been commonly used in the production of optical waveguides, with varying amounts of GeO,