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X-ray photoelectron spectroscopy and electron spin resonance studies on O2 and N2O plasma oxidation of silicon

โœ Scribed by Atsushi Masuda; Yasuto Yonezawa; Akiharu Morimoto; Minoru Kumeda; Tatsuo Shimizu

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
507 KB
Volume
39
Category
Article
ISSN
0921-5107

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We have carried out photoelectron spectroscopy (PES) and soft X-ray absorption spectroscopy (XAS) for both Sm 2 Mo 2 O 7 and Tb 2 Mo 2 O 7 with synchrotron radiation. Valence band PES depending on excitation photon energy proves that electron structures of the valence bands are composed of 4f (Sm, T