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X-ray photoelectron spectroscopy and atomic force microscopy characterization of the effects of etching ZnxCd1−xTe surfaces

✍ Scribed by M.A. George; M. Azoulay; H.N. Jayatirtha; A. Burger; W.E. Collins; E. Silberman

Book ID
118366574
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
930 KB
Volume
296
Category
Article
ISSN
0039-6028

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