X-ray photoelectron spectroscopy (XPS) and thermal analysis were used to study a series of lead oxides. )(-ray photoelectron spectra suggest that some minium (Pb3Q4) samples contain carbonate groups and an excess of oxygen in superficial layers. These samples, if used in paints' production cause the
X-ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides
β Scribed by G. Deroubaix; P. Marcus
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 634 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0142-2421
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β¦ Synopsis
Abstract
Various copper and zinc compounds (Cu, Zn, Cuο£ΏZn alloy, Cu~2~O, CuO, Cu~2~S, ZnO, ZnS) have been synthesized and characterized by electron spectroscopy (XPS). Data on the 2~p~~3/2~ levels of Cu, Zn and S, the 1s level of O, the L~3~M~45~M~45~ Auger transitions of Cu and Zn, the valence bands and the modified Auger parameters are reported. The results obtained with these reference compounds allow qualitative and quantitative interpretation of XPS analyses on mixtures of these compounds.
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## Abstract Xβray (XS) and Xβray photoelectron (XPS) spectra are reported for vanadium oxides. Because of the multivalent character of vanadium in the oxide system high quality measurements can be used for chemical shift investigation. Both inner level and valence band spectroscopy give information