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X-ray photoelectron spectroscopic and x-ray diffractometric characterization of alkylimidazole films on copper oxide and alkylimidazolato copper(II) complexes

✍ Scribed by S. Yoshida; H. Ishida; J.S. Jen


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
441 KB
Volume
44
Category
Article
ISSN
0169-4332

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