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X-ray photoelectron diffraction investigation of the (2 × 2) overlayers of Cs and K on Cu(111)

✍ Scribed by A.V. de Carvalho; D.P. Woodruff; M. Kerkar


Book ID
116066828
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
577 KB
Volume
320
Category
Article
ISSN
0039-6028

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