X-ray nanofocusing using a piezoelectric deformable mirror and at-wavelength metrology methods

✍ Scribed by Nakamori, Hiroki; Matsuyama, Satoshi; Imai, Shota; Kimura, Takashi; Sano, Yasuhisa; Kohmura, Yoshiki; Tamasaku, Kenji; Yabashi, Makina; Ishikawa, Tetsuya; Yamauchi, Kazuto

• Book ID: 122783708
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 705 KB
• Volume: 710
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2012.11.059