✦ LIBER ✦
X-ray nano-diffraction: 100 nm resolution obtained in a novel imaging technique for strain measurement at buried interfaces
✍ Scribed by S. Lagomarsino; S. Di Fonzo; W. Jark; C. Giannini; L. De Caro; A. Cedola
- Book ID
- 108411127
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 841 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0167-9317
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