X-ray multiple diffraction as a new approach to structural characterization of III-nitride layers

✍ Scribed by Kyutt, R. N.; Scheglov, M. P.

• Book ID: 120602031
• Publisher: John Wiley and Sons
• Year: 2013
• Tongue: English
• Weight: 314 KB
• Volume: 10
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.201200688