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X-ray microanalysis of a hafnium carbide film oxidized at high temperature

โœ Scribed by C.B. Bargeron; R.C. Benson


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
310 KB
Volume
36
Category
Article
ISSN
0257-8972

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EIVI Fig. 1. Cyclovoltammograins of 1 and 4. (---): Voltammogram of 1 embedded in a carbon paste electrode [12] in DMSO/O.l M Bu,NC10,, scan rate 1 mVs-', Ep(red) = -0.20, -0.46, -0.69 V; E,(ox) = -0.15, -0.41, -0.58 V. (--): Solution cyclic voltammogram of 4 in DMSO/O.I M Bu,NCIO, on a 0.07 cm2 Pt