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X-ray line profile analysis in alakali-treated ramie fiber

โœ Scribed by K. P. Sao; B. K. Samantaray; S. Bhattacherjee


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
312 KB
Volume
60
Category
Article
ISSN
0021-8995

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The x-ray diffraction line profiles of the 002 reflections of graphite samples ground in a ball mill for periods up to 90 hours were studied using newly developed peak analysis methods that permitted separation of overlapping peaks having different peak positions, intensities, and line-breadths. For