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X-ray interferometer based on fresnel zone plates

✍ Scribed by L. A. Haroutiunyan; K. G. Trouni; G. M. Hovhannisyan


Book ID
111505762
Publisher
Allerton Press, Inc.
Year
2011
Tongue
English
Weight
171 KB
Volume
46
Category
Article
ISSN
1068-3372

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## Abstract Stacking technique was developed in order to increase focusing efficiency of Fresnel zone plates at high energies. Two identical Si chips each of which containing Fresnel zone plates were used for stacking. Alignment of the chips was achieved by on‐line observation of the __moirΓ©__ patt