X-ray intensity measurements on large crystals by energy-dispersive diffractometry. IV. Determination of anomalous scattering factors near the absorption edges of GaAs by the one-intensity-ratio method

✍ Scribed by Fukamachi, T. ;Hosoya, S. ;Kawamura, T. ;Okunuki, M.

• Book ID: 114522650
• Publisher: International Union of Crystallography
• Year: 1979
• Weight: 393 KB
• Volume: 35
• Category: Article
• ISSN: 0567-7394
• DOI: 10.1107/s056773947900187x