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X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns

✍ Scribed by Byoung Chul Ko; Seong Hoon Kim; Jae-Yeal Nam


Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
925 KB
Volume
24
Category
Article
ISSN
0897-1889

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