✦ LIBER ✦
X-Ray Emission Spectroscopic Analysis for Crystallized Amorphous Silicon Induced by Excimer Laser Annealing
✍ Scribed by John, Young-Min; Kim, Dong-Hwan; Cho, Woon-Jo; Lee, Seok; Kurmaev, E.Z.
- Book ID
- 115400135
- Publisher
- Korean Journal of Optics and Photonics
- Year
- 2001
- Tongue
- English
- Weight
- 254 KB
- Volume
- 5
- Category
- Article
- ISSN
- 1226-4776
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