X-ray emission of hollow atoms formed by highly charged argon and xenon ions below a beryllium surface

✍ Scribed by Yongtao Zhao; Guoqing Xiao; Xiaoan Zhang; Zhihu Yang; Yanping Zhang; Wenlong Zhan; Ximeng Chen; Fuli Li

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 330 KB
• Volume: 258
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.12.178

✦ Synopsis

The X-ray emission induced by highly charged argon and xenon ions impinging on a beryllium surface is investigated. It is found that spectra of the X-ray induced by Ar 17,18+ interacting with the surface are very different from those of the X-ray induced by Ar 17,18+ interacting with residual gases. The result provides an experimental evidence for the existence of hollow atoms below the surface. Several unexpected X-ray lines are also found in the experiment. Firstly, K X-rays are observed when Ar 16+ ions which initially have no K shell holes interact with the surface. Secondly, if there are more than 2 M shell vacancies at the initial time, strong Maa two-electron-onephoton (TEOP) transitions are found in the collisions of Xe 28+,29+,30+ ions with the surface.