✦ LIBER ✦
X-ray electrono-optical and SIMS characterization of Si crystals implanted with Bi ions before and after rapid thermal annealing
✍ Scribed by J. Auleytner; Mgr. J. Adamczewska; Dr. A. Barcz; Dr. J. Górecka; Dr. K. Regiński
- Publisher
- John Wiley and Sons
- Year
- 1995
- Tongue
- English
- Weight
- 312 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0232-1300
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