๐”– Bobbio Scriptorium
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X-Ray Electron Charge Density Distribution in Silicon

โœ Scribed by U. Pietsch; V. G. Tsirelson; R. P. Ozerov


Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
440 KB
Volume
137
Category
Article
ISSN
0370-1972

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A new, nonlinear X-ray diffraction technique is described which permits the direct experimental det~m~atio~ of the valence electron charge density in a wide variety of covalently bonded materials. We describe here the theory of a new, nor&near X-ray diffraction technique which permits a direct expe