✦ LIBER ✦
X-ray Diffraction Topography at a Synchrotron Radiation Source Applied to the Study of Bonded Silicon on Insulator Material
✍ Scribed by J. Härtwig; S. Köhler; W. Ludwig; H. Moriceau; M. Ohler; E. Prieur
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 560 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0232-1300
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