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X-ray diffraction study of TiO2 thin films on mica

✍ Scribed by Pekka Eskelinen


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
543 KB
Volume
100
Category
Article
ISSN
0022-4596

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Thin Film Analysis by X-Ray Scattering (
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Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr