𝔖 Bobbio Scriptorium
✦   LIBER   ✦

X-ray diffraction study of TiN coatings sputtered at different substrate temperatures

✍ Scribed by V. Valvoda; R. Kužel Jr.; R. Černý; L. Dobiášová; J. Musil; V. Poulek

Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
543 KB
Volume
23
Category
Article
ISSN
0232-1300

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of ion beam sputtered Z
Characterization of ion beam sputtered ZrN coatings prepared at different substrate temperatures
✍ M. M. Larijani; M. Kiani; M. Tanhayi; A. Majdabadi 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 183 KB

## Abstract Zirconium nitride (ZrN) coatings were prepared on Si (100) by single ion beam sputtering in N~2~ and Ar mixture at different substrate temperatures. Structure and morphology of the ZrN coatings were analyzed using X‐ray diffraction and atomic force microscopy. Rutherford backscattering

Application of X-ray diffraction topogra
Application of X-ray diffraction topography for the study of Al single crystals plastically deformed at low temperatures
✍ Dr. I. G. Novikova; V. I. Startsev; D. A. Didenko 📂 Article 📅 1975 🏛 John Wiley and Sons 🌐 English ⚖ 699 KB

## Abstract The Lang method has been used to investigate regularities and peculiarities of formation of Al single crystal dislocation structure in various stages of the stress‐strain curve at 77.3 and 4.2°K up to high strains. The low temperature deformation of crystals has been found to cause a sh