✦ LIBER ✦

X-ray diffraction study of the multi component oxide systems.

✍ Scribed by V.E. Sokol'skii; V.P. Kazimirov; V.G. Kuzmenko

Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 168 KB
Volume: 93
Category: Article
ISSN: 0167-7322
DOI: 10.1016/s0167-7322(01)00236-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

X-ray diffraction studies of irradiated

X-ray diffraction studies of irradiated beryllium oxide

✍ B.S. Hickman; T.M. Sabine; R.A. Coyle 📂 Article 📅 1962 🏛 Elsevier Science 🌐 English ⚖ 822 KB

X-ray diffraction study of the palladium

X-ray diffraction study of the palladium-carbon system

✍ Z. Kaszkur; J. Stachurski; J. Pielaszek 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 356 KB

An X-ray diffraction study of the SrBrxI

An X-ray diffraction study of the SrBrxI2−x system

✍ Stanislaw A. Hodorowicz; Harry A. Eick 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 552 KB

Study of oxide precipitates in silicon u

Study of oxide precipitates in silicon using X-ray diffraction techniques

✍ Caha, Ondřej ;Bernatová, Silvie ;Meduňa, Mojmír ;Svoboda, Milan ;Buršík, Jiří 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 294 KB

## Abstract The results of a study of oxide precipitates in Czochralski (CZ) grown silicon using two X‐ray diffraction methods are reported. The diffuse scattering around the Bragg diffraction maxima was measured on a series of samples after various two‐stage annealing treatment. Combining the anal

X-ray diffraction study of the systems K

X-ray diffraction study of the systems KCl-TlCl and KBr-TlBr

✍ Müürsepp, T. ;Haav, A. 📂 Article 📅 1972 🏛 John Wiley and Sons 🌐 English ⚖ 126 KB

Kinetics of Oxidation Processes in the S

Kinetics of Oxidation Processes in the System Co/Ga Studied by in situ X-Ray Diffraction.

✍ Ulrich Koops; Manfred Martin 📂 Article 📅 2003 🏛 John Wiley and Sons ⚖ 58 KB 👁 1 views