𝔖 Bobbio Scriptorium
✦   LIBER   ✦

X-ray diffraction study of small laser-treated spots on WC-Co hardmetal

✍ Scribed by M. Ermrich; D. Stephan; B. Schultrich

Publisher
Springer
Year
1992
Tongue
English
Weight
990 KB
Volume
27
Category
Article
ISSN
0022-2461

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

X-ray diffraction spot mapping - a tool
X-ray diffraction spot mapping - a tool to study structural properties of semiconductor disk laser devices
✍ Zeimer, U. ;Grenzer, J. ;Korn, D. ;DΓΆring, S. ;Zorn, M. ;Pittroff, W. ;Pietsch, πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 397 KB

## Abstract Local lattice plane curvature of semiconductor disk laser devices is determined by an X‐ray spot mapping technique using white beam synchrotron radiation. This method allows for in‐situ studies of the dependence of the lattice plane profile on device temperature and local heating by opt

X-ray diffraction and Raman study of nan
X-ray diffraction and Raman study of nanogranular BaTiO3-CoFe2O4thin films deposited by laser ablation on Si/Pt substrates
✍ Barbosa, J. ;Almeida, B. ;Mendes, J. A. ;Rolo, A. G. ;AraΓΊjo, J. P. πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 337 KB

## Abstract Nanocomposite thin films composed by (BaTiO~3~)~1–__x__~ –(CoFe~2~O~4~)__~x~__ with different cobalt ferrite concentrations (__x__) have been deposited by pulsed laser ablation on platinum covered Si(001) substrates. The films structure was studied by X‐ray diffraction and Raman spectro