✦ LIBER ✦
X-ray diffraction stress measurements in thin films : T. J. Louzon and T. H. Spencer. Solid State Techn. July 1975, p. 25
- Book ID
- 103270215
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 124 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2714
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