✦ LIBER ✦
X-ray diffraction stress analysis of ferroelectric thin films with ideal (h k l) textures considering the piezoelectric coupling effect
✍ Scribed by Huaping Wu; Linzhi Wu; Jiquan Li; Guozhong Chai; Shanyi Du
- Book ID
- 104081458
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 196 KB
- Volume
- 405
- Category
- Article
- ISSN
- 0921-4526
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