X-ray diffraction profiles from single crystals of Cu–Ge alloy containing heavily faulted regions

✍ Scribed by Takama, T. ;Yokota, N. ;Sato, S.

• Book ID: 114499068
• Publisher: International Union of Crystallography
• Year: 1979
• Tongue: English
• Weight: 1016 KB
• Volume: 12
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889879013236