๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

X-ray diffraction, photoluminescence and composition standards of compound semiconductors

โœ Scribed by A. Roshko; K. Bertness; J. Armstrong; R. Marinenko; M. Salit; L. Robins; A. Paul; R. Matyi

Book ID
104556390
Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
165 KB
Volume
0
Category
Article
ISSN
1862-6351

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

X-ray synchrotron diffraction studies of
X-ray synchrotron diffraction studies of III-V semiconductor compounds implanted with hydrogen
โœ Wieteska, K. ;Wierzchowski, W. ;Graeff, W. ;Gawlik, G. ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 405 KB

## Abstract GaAs crystals and Al~0.43~Ga~0.57~As epitaxial layers of low dislocation density were implanted with 146 keV, 100 keV and 60 keV H^+^ ions and studied by recording of rocking curves, reciprocal space mapping and Braggโ€type section topography. The Xโ€ray investigation were performed also