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X-ray diffraction microtomography (XRD-CT), a novel tool for non-invasive mapping of phase development in cement materials

✍ Scribed by G. Artioli; T. Cerulli; G. Cruciani; M. C. Dalconi; G. Ferrari; M. Parisatto; A. Rack; R. Tucoulou


Book ID
105893185
Publisher
Springer
Year
2010
Tongue
English
Weight
421 KB
Volume
397
Category
Article
ISSN
1618-2650

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