✦ LIBER ✦
X-ray diffraction micro-imaging of strain in laterally overgrown GaAs layers. Part I: analysis of a single GaAs stripe
✍ Scribed by A. Czyzak; J.Z. Domagala; G. Maciejewski; Z.R. Zytkiewicz
- Book ID
- 106021048
- Publisher
- Springer
- Year
- 2008
- Tongue
- English
- Weight
- 990 KB
- Volume
- 91
- Category
- Article
- ISSN
- 1432-0630
No coin nor oath required. For personal study only.