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X-ray Diffraction Measurement Below 1 K

✍ Scribed by H. Suzuki; S. Naher; T. Shimoguchi; M. Mizuno; A. Ryu; H. Fujishita

Book ID: 110340656
Publisher: Springer US
Year: 2002
Tongue: English
Weight: 91 KB
Volume: 128
Category: Article
ISSN: 0022-2291
DOI: 10.1023/a:1015729021796

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