X-Ray Diffraction Imaging: Technology and Applications

✍ Scribed by Greenberg, Joel(Editor);Iniewski, Krzysztof(Editor)

• Publisher: CRC Press
• Year: 2018
• Tongue: English
• Leaves: 278
• Category: Library

✦ Synopsis

This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike. 　



　

Teaches novel methods for X-ray diffraction imaging　

Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms



Features state-of-the-art work of international authors from both academia and industry.



Includes practical applications in the medical, industrial, and security sectors

✦ Table of Contents

Cover......Page 1
Half Title......Page 2
Series Page......Page 3
Title Page......Page 10
Copyright Page......Page 11
Contents......Page 12
Series Editor......Page 14
Editor......Page 16
Contributors......Page 18
Introduction to X-Ray Diffraction Imaging......Page 20
1. Coded Aperture X-Ray Diffraction Tomography......Page 24
1.1 Introduction......Page 25
1.2.1 Tomographic Imaging......Page 26
1.2.2 X-Ray Diffraction......Page 28
1.2.3 XRDT Architectures......Page 32
1.2.3.1 Coherent Scatter Computed Tomography (CSCT)......Page 35
1.2.3.2 Direct Tomography (DT)......Page 36
1.2.3.3 Kinetic Depth Effect X-Ray Diffraction (KDEXRD) Imaging......Page 37
1.2.3.5 Coded Aperture X-Ray Diffraction Tomography (CA-XRDT)......Page 38
1.3 Coded Aperture X-Ray Diffraction Tomography (CA-XRDT)......Page 39
1.3.1 Key CA-XRDT Components......Page 41
1.3.1.1 Coded Aperture......Page 42
1.3.1.2 X-Ray Source......Page 45
1.3.1.3 Detectors......Page 46
1.3.2.1 Forward Model......Page 49
1.3.2.2 Estimation Algorithms......Page 51
1.3.2.3 Classification Algorithms......Page 52
1.4.1 Pencil Beam......Page 53
1.4.2 Fan Beam......Page 55
1.4.3 Cone Beam......Page 56
1.5.1 Multi-View CA-XRDT......Page 58
1.5.2 Structured Illumination XRDT......Page 60
1.6.1 Security......Page 63
1.6.2 Medical Imaging......Page 65
1.6.3 Industrial and Environmental Inspection......Page 67
References......Page 68
2. Semiconductor Sensors for XRD Imaging......Page 76
2.1.1 Introduction......Page 77
2.1.2 Indirect Conversion Using Scintillator Materials......Page 78
2.1.3 Director Conversion Using Semiconductor Materials......Page 79
2.1.4 Application Example: Computed Tomography......Page 83
2.1.5 Application Example: Baggage Scanning......Page 84
2.2.1.1 Inorganic Scintillators......Page 87
2.2.2.1 Photomultiplier Tubes......Page 88
2.2.2.2 Avalanche Photodiodes......Page 90
2.3.1 Introduction to Semiconductor Materials......Page 91
2.3.2 Germanium......Page 92
2.3.4 Cadmium Telluride......Page 93
2.3.5 Cadmium Zinc Telluride......Page 94
2.3.6 Comparison between Semiconductor Materials......Page 96
2.4.2 ASIC to Sensor Attachment......Page 98
2.4.3.1 Pilatus Photon-Counting Readout......Page 99
2.4.3.2 DxRay Photon-Counting Readout......Page 100
2.4.3.3 Timepix Photon-Counting Readout......Page 101
2.4.3.4 HEXITEC Spectroscopic Readout......Page 102
References......Page 103
3. Integrated Circuits for XRD Imaging......Page 106
3.1 Introduction......Page 107
3.2.1 IC Technology......Page 108
3.2.2 IC Design Process......Page 110
3.2.4 Photon Counting ICs......Page 112
3.2.5 Spectroscopic ICs......Page 114
3.2.5.1 Analog Front-End......Page 115
3.2.5.3 Equivalent Noise Charge......Page 116
3.2.5.4 Signal Shaping......Page 118
3.3.1.1 TIMEPIX and MEDIPIX......Page 119
3.3.1.2 ChromAIX IC......Page 120
3.3.1.3 PILATUS IC......Page 121
3.3.2.1 IDEF-X......Page 122
3.3.2.2 VAS UM/TAT4......Page 124
3.3.2.3 HEXITEC......Page 125
3.4.2 Energy Calibration......Page 126
3.4.3 Charge Sharing Corrections......Page 127
3.4.4 Pile-Up Effects......Page 128
3.4.5 Dark Current Correction......Page 130
3.5 Conclusions......Page 131
References......Page 132
4. Applications of X-Ray Diffraction Imaging in Medicine......Page 136
4.1 Introduction and Background......Page 137
4.2.1 Diagnostic Imaging Techniques Used in Current Clinical Practice......Page 138
4.2.2 XRD Imaging for Osteoporosis Diagnosis......Page 139
4.3.1 Diagnostic Imaging Techniques Used in Current Clinical Practice......Page 140
4.3.2 XRD Patterns for Healthy and Diseased Breast Tissue......Page 141
4.3.4 XRD Imaging of Lumpectomy Specimens: CSCT Approach......Page 144
4.3.5 XRD Imaging of Lumpectomy Specimens: Coded Aperture Approach......Page 145
4.3.5.1 Monte Carlo Simulations......Page 147
4.3.5.2 Experimental Implementation......Page 148
4.4.1 Standard Treatment......Page 150
4.4.2 Potential for XRD Imaging......Page 151
4.5 Brain Imaging......Page 152
4.6 Liver Imaging......Page 154
4.8 Radiation Dose Analysis......Page 155
4.9.1 Multiple Scatter Noise......Page 156
4.9.2 Scan Time......Page 157
4.10 Summary......Page 158
References......Page 159
5.1 Introduction......Page 164
5.1.1 Materials in Society......Page 165
5.1.2 Bragg’s Law and X-Ray Diffraction......Page 166
5.2.1 Crystallinity and Long-Range Order......Page 168
5.2.2 Spectra Features of Atomic and Molecular Crystals......Page 170
5.2.3 Spectral Anomalies Due to Crystalline Texture......Page 175
5.3.1 Non-Crystallinity and Short-Range Order......Page 177
5.3.2 Spectral Features of Amorphous Solids and Liquids......Page 178
5.4.1 X-Ray Diffraction Features for Classes of Materials......Page 181
5.4.2 Unsupervised K-Means Cluster Analysis......Page 183
References......Page 185
6. X-Ray Diffraction and Focal Construct Technology......Page 188
6.1 X-Ray Diffraction......Page 189
6.2 Aviation Screening......Page 196
6.3 Focal Construct Technology (FCT): Background......Page 199
6.4.1 Security: Aviation Screening......Page 204
6.4.3 Medical Diagnostics......Page 205
References......Page 208
7.1 Introduction......Page 212
7.2.1 X-Ray Diffraction from a Single Voxel......Page 214
7.2.2 Direct Tomography......Page 216
7.2.3 Pencil Beam Angular Dispersive X-Ray Diffraction Tomography (AD-XDT)......Page 217
7.2.4 Fan Beam Angular Dispersive X-Ray Diffraction Tomography......Page 218
7.2.5 Energy-Dispersive Coherent Scatter Computerized Tomography......Page 220
7.3 Recovering Full-Momentum Transfer Space Profile......Page 222
7.4 Acquisition Time and Dosage Reduction via Interior Tomography......Page 225
7.5 Conclusions......Page 229
References......Page 230
8. Energy-Resolving Detectors for XDi Airport Security Systems......Page 234
8.2 Physical Principle of X-Ray Diffraction Screening System......Page 235
8.3 History of XRD Security-Scanners and Motivation for Next-Generation XDi Systems......Page 237
8.4 XDi Functional Principle......Page 241
8.5.1 Germanium Detectors of XRD3X00 Hold-Baggage Screening Systems......Page 244
8.5.2 Energy-Resolving Room-Temperature Semi-Conductors for XDi Systems......Page 248
8.6 Two Approaches to RTSD for XDi......Page 251
8.6.1 The CdTe Edge-On Array Detector (EdgAr)......Page 252
8.6.2 The CZT Imaging Diffraction Detector (IMADIF)......Page 254
8.7.1 Experimental Conditions of Source Measurements......Page 255
8.7.2 Spectral Parameters......Page 256
8.7.3 Spectra of CZT and CdTe Detectors......Page 259
8.7.4 RIMADIF Thermal Stability Test......Page 260
8.7.5 EdgAr+ Thermal Stability Test......Page 261
8.7.6.1 Dead and Bad Pixels......Page 262
8.7.6.3 Intrinsic Peak-Efficiency Histogram......Page 264
8.8 Principle of Threat Detection......Page 265
8.9 Summary and Conclusion......Page 266
Bibliography......Page 267
Index......Page 272