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X-ray diffraction data and Rietveld refinement of CuGaxIn1-xSe2 (x=0.15 and 0.50)

✍ Scribed by Friedrich, E. J.; Fernández-Ruiz, R.; Merino, J. M.; León, M.

Book ID: 115451692
Publisher: International Centre for Diffraction Data
Year: 2010
Tongue: English
Weight: 757 KB
Volume: 25
Category: Article
ISSN: 0885-7156
DOI: 10.1154/1.3478374

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