X-ray Diffraction Area Mapping of Preferred Orientation and Phase Change in TiO 2 Thin Films Deposited by Chemical Vapor Deposition

✍ Scribed by Hyett, Geoffrey; Green, Mark; Parkin, Ivan P.

• Book ID: 124060565
• Publisher: American Chemical Society
• Year: 2006
• Tongue: English
• Weight: 711 KB
• Volume: 128
• Category: Article
• ISSN: 0002-7863
• DOI: 10.1021/ja062766q