X-ray diffraction and I-V curve studies on the Al/Ti/Al/n-GaAs Schottky contact after annealing at various temperatures

✍ Scribed by Jiann-Ruey Chen; Nai-Luon Chang

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 274 KB
• Volume: 65-66
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(93)90752-w