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X-ray diffraction analysis of the defect structure in AlxGa1 −xN films grown by metalorganic chemical vapor deposition

✍ Scribed by Y. S. Park; K. H. Kim; J. J. Lee; H. S. Kim; T. W. Kang; H. X. Jiang; J. Y. Lin

Book ID: 111590104
Publisher: Springer
Year: 2004
Tongue: English
Weight: 74 KB
Volume: 39
Category: Article
ISSN: 0022-2461
DOI: 10.1023/b:jmsc.0000016202.96505.51

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