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X-ray diffraction analysis of SnO2 films prepared by oxidation of tin films

✍ Scribed by N.P. Sinha; M. Misra

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 81 KB
Volume: 101
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(83)90271-7

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