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X-ray detectors for digital radiography

✍ Scribed by Yaffe, M J; Rowlands, J A

Book ID
121493125
Publisher
Institute of Physics
Year
1997
Tongue
English
Weight
803 KB
Volume
42
Category
Article
ISSN
0031-9155

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This paper proposes a non-uniformity emendation technique to solve the problem of non-linear of detector sensitivity for non-uniformity of amorphous silicon flat-panel detectors based on pixel sensitivity mean value. The technique corrects the testing image with the emendation factors obtained by th