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x-ray coherent scatter in the determination of thickness of a SiC matrix (10–200 μm) surrounding a woven carbon structure

✍ Scribed by P. Zhu; D. Babot; G. Berodias; G. Peix; S. Abbe


Book ID
103989656
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
833 KB
Volume
45
Category
Article
ISSN
0969-8043

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