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X-ray Analysis of Residual Stresses in C/SiC Composites

โœ Scribed by M. Broda; A. Pyzalla; W. Reimers


Book ID
110269421
Publisher
Springer Netherlands
Year
1999
Tongue
English
Weight
389 KB
Volume
6
Category
Article
ISSN
0929-189X

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Measurement of residual stresses in Al2O
โœ L. Hehn; C. Zheng; J. J. Mecholsky; C. R. Hubbard ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Springer ๐ŸŒ English โš– 569 KB

Using an X-ray diffraction technique, macro-residual stresses were measured in laminated composites consisting of alternating layers of ~-AI203 and nickel. The in-plane thermal mismatch stresses which develop during fabrication were found to be compressive and tensile in the ~-AI203 and nickel layer