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X-ray absorption spectroscopy study of thermally annealed Cu–Al–O thin films

✍ Scribed by Hsieh, Ping-Hung; Lu, Yang-Ming; Hwang, Weng-Sing; Jang, Wei-Luen; Dong, Chung-Li; Chan, Ting-Shan

No coin nor oath required. For personal study only.

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